"A 409 GOPS/W Adaptive and Resilient Domino Register File in 22 nm Tri-Gate ..."

Jaydeep P. Kulkarni et al. (2016)

> Home

Details and statistics

DOI: 10.1109/JSSC.2015.2463083

access: closed

type: Journal Article

metadata version: 2024-10-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jssc/KulkarniTANATD16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jssc/KulkarniTANATD16
Jaydeep P. Kulkarni, Carlos Tokunaga, Paolo A. Aseron, Trang Nguyen, Charles Augustine, James W. Tschanz, Vivek De:
A 409 GOPS/W Adaptive and Resilient Domino Register File in 22 nm Tri-Gate CMOS Featuring In-Situ Timing Margin and Error Detection for Tolerance to Within-Die Variation, Voltage Droop, Temperature and Aging. IEEE J. Solid State Circuits 51(1): 117-129 (2016)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.