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"A Highly Reliable RRAM Physically Unclonable Function Utilizing ..."
Bohan Lin et al. (2021)
- Bohan Lin, Yachuan Pang, Bin Gao, Jianshi Tang, Dong Wu, Ting-Wei Chang, Wei-En Lin, Xiaoyu Sun, Shimeng Yu, Meng-Fan Chang, He Qian, Huaqiang Wu:
A Highly Reliable RRAM Physically Unclonable Function Utilizing Post-Process Randomness Source. IEEE J. Solid State Circuits 56(5): 1641-1650 (2021)
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