"Stuck-open testable scan-based CMOS sequential circuits."

Bong-Hee Park, Premachandran R. Menon (1992)

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DOI: 10.1109/4.149427

access: closed

type: Journal Article

metadata version: 2025-02-03

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Bong-Hee Park, Premachandran R. Menon:
Stuck-open testable scan-based CMOS sequential circuits. IEEE J. Solid State Circuits 27(9): 1237-1244 (1992)

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