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"Modeling and measurement of substrate coupling in Si-bipolar IC's up to 40 ..."

Martin Pfost, Hans-Martin Rein (1998)

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DOI: 10.1109/4.663563

access: closed

type: Journal Article

metadata version: 2022-07-05

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Martin Pfost, Hans-Martin Rein:
Modeling and measurement of substrate coupling in Si-bipolar IC's up to 40 GHz. IEEE J. Solid State Circuits 33(4): 582-591 (1998)

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