"An Assessment of µ-Czochralski, Single-Grain Silicon Thin-Film ..."

Nitz Saputra et al. (2008)

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DOI: 10.1109/JSSC.2008.922404

access: closed

type: Journal Article

metadata version: 2020-08-30

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Nitz Saputra, Mina Danesh, Alessandro Baiano, Ryoichi Ishihara, John R. Long, Nobuo Karaki, Satoshi Inoue:
An Assessment of µ-Czochralski, Single-Grain Silicon Thin-Film Transistor Technology for Large-Area, Sensor and 3-D Electronic Integration. IEEE J. Solid State Circuits 43(7): 1563-1576 (2008)

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