"Built-in current sensor for ΔI_DDQ testing."

Josep Rius Vázquez, José Pineda de Gyvez (2004)

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DOI: 10.1109/JSSC.2003.822900

access: closed

type: Journal Article

metadata version: 2022-04-27

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Josep Rius Vázquez, José Pineda de Gyvez:
Built-in current sensor for ΔI_DDQ testing. IEEE J. Solid State Circuits 39(3): 511-518 (2004)

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