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"A Modular, Direct Time-of-Flight Depth Sensor in 45/65-nm 3-D-Stacked CMOS ..."
Augusto Ronchini Ximenes et al. (2019)
- Augusto Ronchini Ximenes, Preethi Padmanabhan, Myung-Jae Lee, Yuichiro Yamashita, Dun-Nian Yaung, Edoardo Charbon:
A Modular, Direct Time-of-Flight Depth Sensor in 45/65-nm 3-D-Stacked CMOS Technology. IEEE J. Solid State Circuits 54(11): 3203-3214 (2019)
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