"Automating Stressmark Generation for Testing Processor Voltage Fluctuations."

Youngtaek Kim et al. (2013)

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DOI: 10.1109/MM.2013.70

access: closed

type: Journal Article

metadata version: 2017-05-20

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  - https://dblp.org/rec/journals/micro/KimJPMSBG13
Youngtaek Kim, Lizy Kurian John, Sanjay Pant, Srilatha Manne, Michael J. Schulte, William Lloyd Bircher, Madhu Saravana Sibi Govindan:
Automating Stressmark Generation for Testing Processor Voltage Fluctuations. IEEE Micro 33(4): 66-75 (2013)

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