"Modelling of through silicon via and devices electromagnetic coupling."

Mohamed Abouelatta-Ebrahim et al. (2011)

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DOI: 10.1016/J.MEJO.2010.10.017

access: closed

type: Journal Article

metadata version: 2023-06-12

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Mohamed Abouelatta-Ebrahim, Rabah Dahmani, Olivier Valorge, Françis Calmon, Christian Gontrand:
Modelling of through silicon via and devices electromagnetic coupling. Microelectron. J. 42(2): 316-324 (2011)

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