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"Bias temperature instability from gate charge characteristics ..."
M. Alwan et al. (2007)
- M. Alwan, B. Beydoun, K. Ketata, M. Zoaeter:
Bias temperature instability from gate charge characteristics investigations in N-Channel Power MOSFET. Microelectron. J. 38(6-7): 727-734 (2007)
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