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"Modeling of single/multiple-bit upset effects on logic circuits applying ..."

Rasoul Farjaminezhad, Saeed Safari, Amir-Masoud Eftekhari-Moghadam (2021)

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DOI: 10.1016/J.MEJO.2021.105249

access: closed

type: Journal Article

metadata version: 2021-12-15

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  - https://dblp.org/rec/journals/mj/FarjaminezhadSE21a
Rasoul Farjaminezhad, Saeed Safari, Amir-Masoud Eftekhari-Moghadam:
Modeling of single/multiple-bit upset effects on logic circuits applying Recurrent Neural Network. Microelectron. J. 117: 105249 (2021)

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