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"Reliability analysis of Junction-less Double Gate (JLDG) MOSFET for ..."

Abhinav Gupta, Sanjeev Rai (2017)

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DOI: 10.1016/J.MEJO.2017.04.009

access: closed

type: Journal Article

metadata version: 2020-02-22

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Abhinav Gupta, Sanjeev Rai:
Reliability analysis of Junction-less Double Gate (JLDG) MOSFET for analog/RF circuits for high linearity applications. Microelectron. J. 64: 60-68 (2017)

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