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"Total ionizing dose hardness analysis of transistors in commercial 180 nm ..."
Mukesh Kumar et al. (2021)
- Mukesh Kumar, Jagpal Singh Ubhi
, Sanjeev Basra, Anuj Chawla, H. S. Jatana:
Total ionizing dose hardness analysis of transistors in commercial 180 nm CMOS technology. Microelectron. J. 115: 105182 (2021)
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