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"Impact of work-function variation on analog figures-of-merits for ..."

Wei-feng Lü, Liang Dai (2019)

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DOI: 10.1016/J.MEJO.2018.12.004

access: closed

type: Journal Article

metadata version: 2020-02-22

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Wei-feng Lü, Liang Dai:
Impact of work-function variation on analog figures-of-merits for high-k/metal-gate junctionless FinFET and gate-all-around nanowire MOSFET. Microelectron. J. 84: 54-58 (2019)

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