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"Fast convolution based thermal model for 3D-ICs: Methodology, accuracy ..."
F. L. T. Maggioni et al. (2014)
- F. L. T. Maggioni, Herman Oprins, Eric Beyne
, Ingrid De Wolf, Martine Baelmans
:
Fast convolution based thermal model for 3D-ICs: Methodology, accuracy analysis and package impact. Microelectron. J. 45(12): 1746-1752 (2014)
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