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"Reliability of reverse properties of power semiconductor devices: : ..."

Václav Papez, B. Kojecký, D. Sámal (2008)

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DOI: 10.1016/J.MEJO.2007.11.014

access: closed

type: Journal Article

metadata version: 2020-07-02

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Václav Papez, B. Kojecký, D. Sámal:
Reliability of reverse properties of power semiconductor devices: : Influence of surface dielectric layer and its experimental verification. Microelectron. J. 39(6): 851-856 (2008)

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