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"Simulation study on ferroelectric layer thickness dependence RF/Analog and ..."

Rajesh Saha (2021)

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DOI: 10.1016/J.MEJO.2021.105081

access: closed

type: Journal Article

metadata version: 2021-07-12

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Rajesh Saha:
Simulation study on ferroelectric layer thickness dependence RF/Analog and linearity parameters in ferroelectric tunnel junction TFET. Microelectron. J. 113: 105081 (2021)

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