"Terahertz high electron mobility transistor characterization and on-wafer ..."

Dong Xiong et al. (2025)

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DOI: 10.1016/J.MEJO.2025.106846

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type: Journal Article

metadata version: 2025-09-21

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Dong Xiong, Jing Bai, Yuan-Ting Lyu, Ao Zhang, Jianjun Gao:
Terahertz high electron mobility transistor characterization and on-wafer measurement. Microelectron. J. 165: 106846 (2025)

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