"Progressive module redundancy for fault-tolerant designs in nanoelectronics."

Tian Ban, Lirida A. B. Naviner (2011)

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DOI: 10.1016/J.MICROREL.2011.06.020

access: closed

type: Journal Article

metadata version: 2022-10-02

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Tian Ban, Lirida A. B. Naviner:
Progressive module redundancy for fault-tolerant designs in nanoelectronics. Microelectron. Reliab. 51(9-11): 1489-1492 (2011)

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