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"Evaluation of the generation mechanisms at surface and in the bulk of the ..."

Giacomo Barletta, Giuseppe Currò (2007)

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DOI: 10.1016/J.MICROREL.2007.01.004

access: closed

type: Journal Article

metadata version: 2020-02-22

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Giacomo Barletta, Giuseppe Currò:
Evaluation of the generation mechanisms at surface and in the bulk of the silicon by current transient technique. Microelectron. Reliab. 47(4-5): 810-814 (2007)

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