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"Experience in HBM ESD testing of high pin count devices."

Tilo Brodbeck, Reinhold Gaertner (2007)

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DOI: 10.1016/J.MICROREL.2006.11.010

access: closed

type: Journal Article

metadata version: 2020-02-22

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Tilo Brodbeck, Reinhold Gaertner:
Experience in HBM ESD testing of high pin count devices. Microelectron. Reliab. 47(7): 1025-1029 (2007)

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