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"Through silicon in-circuit logic analysis for localizing logic pattern ..."

M. R. Bruce et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.06.107

access: closed

type: Journal Article

metadata version: 2020-02-22

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M. R. Bruce, L. K. Ross, C. Scholz, L. Joshi, Vrajesh Dave, C. M. Chua:
Through silicon in-circuit logic analysis for localizing logic pattern failures. Microelectron. Reliab. 52(9-10): 2043-2049 (2012)

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