"Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser ..."

Matteo Buffolo et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.06.058

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type: Journal Article

metadata version: 2024-05-07

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Matteo Buffolo, M. Pietrobon, Carlo De Santi, F. Samparisi, Michael L. Davenport, John E. Bowers, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini:
Degradation mechanisms of heterogeneous III-V/Silicon loop-mirror laser diodes for photonic integrated circuits. Microelectron. Reliab. 88-90: 855-858 (2018)

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