"Status and trends of silicon RF technology."

Joachim N. Burghartz (2001)

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DOI: 10.1016/S0026-2714(00)00198-0

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type: Journal Article

metadata version: 2020-02-22

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Joachim N. Burghartz:
Status and trends of silicon RF technology. Microelectron. Reliab. 41(1): 13-19 (2001)

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