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"Thermal and free carrier laser interferometric mapping and failure ..."

Sergey Bychikhin et al. (2001)

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DOI: 10.1016/S0026-2714(01)00152-4

access: closed

type: Journal Article

metadata version: 2022-03-16

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  - https://dblp.org/rec/journals/mr/BychikhinLPPGGS01
Sergey Bychikhin, Martin Litzenberger, R. Pichler, Dionyz Pogany, Erich Gornik, Gerhard Groos, Matthias Stecher:
Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures. Microelectron. Reliab. 41(9-10): 1501-1506 (2001)

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