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"Investigation of charge trapping/de-trapping induced operation lifetime ..."
Zigui Cao et al. (2008)
- Zigui Cao, Bo Zhang, Xiong Zhang, Elton Lee, Weiran Kong:
Investigation of charge trapping/de-trapping induced operation lifetime degradation in triple SuperFlash® memory cell. Microelectron. Reliab. 48(11-12): 1809-1814 (2008)
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