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"The Failure Analysis of High Voltage Tolerance IO Buffer under ESD."
Tao Cheng, Y. S. Shyu (2004)
- Tao Cheng, Y. S. Shyu:
The Failure Analysis of High Voltage Tolerance IO Buffer under ESD. Microelectron. Reliab. 44(9-11): 1805-1810 (2004)
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