"Study of short-circuiting between adjacent joints under electric field ..."

Y. W. Chiu, Y. C. Chan, S. M. Lui (2002)

> Home

Details and statistics

DOI: 10.1016/S0026-2714(02)00097-5

access: closed

type: Journal Article

metadata version: 2020-02-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/ChiuCL02
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/ChiuCL02
Y. W. Chiu, Y. C. Chan, S. M. Lui:
Study of short-circuiting between adjacent joints under electric field effects in fine pitch anisotropic conductive adhesive interconnects. Microelectron. Reliab. 42(12): 1945-1951 (2002)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.