"Microstructural evaluation and failure analysis of Ag wire bonded to Al pads."

Mi-Ri Choi et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.07.038

access: closed

type: Journal Article

metadata version: 2020-02-22

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Mi-Ri Choi, Hyung-Giun Kim, Taeg-Woo Lee, Young-Jun Jeon, Yong-Keun Ahn, Kyo-Wang Koo, You-Cheol Jang, So-Yeon Park, Jae-Hak Yee, Nam-Kwon Cho, Il-Tae Kang, Sangshik Kim, Seung-Zeon Han, Sung-Hwan Lim:
Microstructural evaluation and failure analysis of Ag wire bonded to Al pads. Microelectron. Reliab. 55(11): 2306-2315 (2015)

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