"Experimental study of WL-CSP reliability subjected to a four-point bend-test."

Cédric Le Coq et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.03.015

access: closed

type: Journal Article

metadata version: 2020-02-22

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Cédric Le Coq, Adellah Tougui, Marie-Pascale Stempin, Laurent Barreau:
Experimental study of WL-CSP reliability subjected to a four-point bend-test. Microelectron. Reliab. 50(7): 1007-1013 (2010)

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