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"Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron ..."

Francesca Danesin et al. (2006)

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DOI: 10.1016/J.MICROREL.2006.07.066

access: closed

type: Journal Article

metadata version: 2024-05-07

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Francesca Danesin, Franco Zanon, Simone Gerardin, Fabiana Rampazzo, Gaudenzio Meneghesso, Enrico Zanoni, Alessandro Paccagnella:
Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors. Microelectron. Reliab. 46(9-11): 1750-1753 (2006)

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