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"Reliability of aluminum-bearing ohmic contacts to SiC under high current ..."

Brian P. Downey et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.07.007

access: closed

type: Journal Article

metadata version: 2020-02-22

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Brian P. Downey, Suzanne E. Mohney, Trevor E. Clark, Joseph R. Flemish:
Reliability of aluminum-bearing ohmic contacts to SiC under high current density. Microelectron. Reliab. 50(12): 1967-1972 (2010)

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