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"Thermal and electrostatic reliability characterization in RF MEMS switches."
Q.-H. Duong et al. (2005)
- Q.-H. Duong, Lionel Buchaillot
, Dominique Collard
, Petra Schmitt, Xavier Lafontan, Patrick Pons
, F. Flourens, Francis Pressecq:
Thermal and electrostatic reliability characterization in RF MEMS switches. Microelectron. Reliab. 45(9-11): 1790-1793 (2005)
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