"Robust FinFET SRAM design based on dynamic back-gate voltage adjustment."

Behzad Ebrahimi, Ali Afzali-Kusha, Hamid Mahmoodi (2014)

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DOI: 10.1016/J.MICROREL.2014.04.015

access: closed

type: Journal Article

metadata version: 2023-03-21

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Behzad Ebrahimi, Ali Afzali-Kusha, Hamid Mahmoodi:
Robust FinFET SRAM design based on dynamic back-gate voltage adjustment. Microelectron. Reliab. 54(11): 2604-2612 (2014)

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