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"Lifetime acceleration model for HAST tests of a pHEMT process."

Peter Ersland, Hei-Ruey Jen, Xinxing Yang (2004)

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DOI: 10.1016/J.MICROREL.2004.03.009

access: closed

type: Journal Article

metadata version: 2020-02-22

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Peter Ersland, Hei-Ruey Jen, Xinxing Yang:
Lifetime acceleration model for HAST tests of a pHEMT process. Microelectron. Reliab. 44(7): 1039-1045 (2004)

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