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"Characterization and analysis of trap-related effects in AlGaN-GaN HEMTs."

Mustapha Faqir et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.07.005

access: closed

type: Journal Article

metadata version: 2024-05-07

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  - journals/mr/FaqirVFDRMZCCLTD07
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  - https://dblp.org/rec/journals/mr/FaqirVFDRMZCCLTD07
Mustapha Faqir, Giovanni Verzellesi, Fausto Fantini, Francesca Danesin, Fabiana Rampazzo, Gaudenzio Meneghesso, Enrico Zanoni, Anna Cavallini, Antonio Castaldini, Nathalie Labat, André Touboul, Christian Dua:
Characterization and analysis of trap-related effects in AlGaN-GaN HEMTs. Microelectron. Reliab. 47(9-11): 1639-1642 (2007)

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