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"Short defect characterization based on TCR parameter extraction."

Abdellatif Firiti et al. (2003)

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DOI: 10.1016/S0026-2714(03)00275-0

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/FiritiFHMGPBL03
Abdellatif Firiti, D. Faujour, Gérald Haller, J. M. Moragues, Vincent Goubier, Philippe Perdu, Felix Beaudoin, Dean Lewis:
Short defect characterization based on TCR parameter extraction. Microelectron. Reliab. 43(9-11): 1563-1568 (2003)

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