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"Qualification procedure for moisture in embedded capacitors."

Hélène Frémont et al. (2014)

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DOI: 10.1016/J.MICROREL.2014.07.117

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/mr/FremontKWWBD14
Hélène Frémont, Jörg Kludt, Massar Wade, Kirsten Weide-Zaage, Isabelle Bord-Majek, Geneviève Duchamp:
Qualification procedure for moisture in embedded capacitors. Microelectron. Reliab. 54(9-10): 2013-2016 (2014)

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