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"Control of the electromagnetic compatibility: An issue for IC reliability."

Jean-Baptiste Gros et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.07.053

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jean-Baptiste Gros, Geneviève Duchamp, Jean-Luc Levant, Christian Marot:
Control of the electromagnetic compatibility: An issue for IC reliability. Microelectron. Reliab. 51(9-11): 1493-1497 (2011)

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