"Investigation of temperature variations on analog/RF and linearity ..."

Neha Gupta, Rishu Chaujar (2016)

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DOI: 10.1016/J.MICROREL.2016.07.095

access: closed

type: Journal Article

metadata version: 2021-04-09

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Neha Gupta, Rishu Chaujar:
Investigation of temperature variations on analog/RF and linearity performance of stacked gate GEWE-SiNW MOSFET for improved device reliability. Microelectron. Reliab. 64: 235-241 (2016)

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