default search action
"High temperature bias-stress-induced instability in power trench-gated ..."
Jifa Hao et al. (2014)
- Jifa Hao, Mark Rioux, Samia A. Suliman, Osama O. Awadelkarim:
High temperature bias-stress-induced instability in power trench-gated MOSFETs. Microelectron. Reliab. 54(2): 374-380 (2014)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.