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"Investigation on BIST assisted failure analysis on digital integrated ..."

Claus Hartmann, M. Wieberneit (2010)

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DOI: 10.1016/J.MICROREL.2010.07.148

access: closed

type: Journal Article

metadata version: 2020-09-04

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Claus Hartmann, M. Wieberneit:
Investigation on BIST assisted failure analysis on digital integrated circuits. Microelectron. Reliab. 50(9-11): 1464-1468 (2010)

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