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"Transient interferometric mapping of carrier plasma during external ..."

Michael Heer et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.06.052

access: closed

type: Journal Article

metadata version: 2022-03-16

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Michael Heer, Krzysztof Domanski, Kai Esmark, Ulrich Glaser, Dionyz Pogany, Erich Gornik, Wolfgang Stadler:
Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology. Microelectron. Reliab. 49(12): 1455-1464 (2009)

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