"Characterization of MIS structures and thin film transistors using ..."

Isaí Hernández et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.06.003

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type: Journal Article

metadata version: 2024-10-06

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Isaí Hernández, César Adrián Pons-Flores, Ivan Garduño, Julio C. Tinoco, Israel Mejia, Magali Estrada:
Characterization of MIS structures and thin film transistors using RF-sputtered HfO₂/HIZO layers. Microelectron. Reliab. 75: 9-13 (2017)

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