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"Analysis and modeling of passive device degradation for a long-term ..."

He Huang, Alexandre Boyer, Sonia Bendhia (2015)

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DOI: 10.1016/J.MICROREL.2015.06.058

access: closed

type: Journal Article

metadata version: 2020-02-22

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He Huang, Alexandre Boyer, Sonia Bendhia:
Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC-DC converter. Microelectron. Reliab. 55(9-10): 2061-2066 (2015)

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