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"Magnetic microscopy for 3D devices: Defect localization with high ..."

Fulvio Infante, Philippe Perdu, Dean Lewis (2009)

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DOI: 10.1016/J.MICROREL.2009.06.041

access: closed

type: Journal Article

metadata version: 2020-02-22

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Fulvio Infante, Philippe Perdu, Dean Lewis:
Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package. Microelectron. Reliab. 49(9-11): 1169-1174 (2009)

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