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"HKMG CMOS technology qualification: The PBTI reliability challenge."

Dimitris P. Ioannou (2014)

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DOI: 10.1016/J.MICROREL.2014.03.018

access: closed

type: Journal Article

metadata version: 2020-02-22

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Dimitris P. Ioannou:
HKMG CMOS technology qualification: The PBTI reliability challenge. Microelectron. Reliab. 54(8): 1489-1499 (2014)

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