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"Assembly reliability assessment and life estimation for a stacked area ..."

Satyanarayan Iyer, Krishnaswami Srihari (2010)

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DOI: 10.1016/J.MICROREL.2010.03.018

access: closed

type: Journal Article

metadata version: 2020-02-22

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Satyanarayan Iyer, Krishnaswami Srihari:
Assembly reliability assessment and life estimation for a stacked area array device. Microelectron. Reliab. 50(7): 978-985 (2010)

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