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"On-chip circuit to monitor long-term NBTI and PBTI degradation."

Keith A. Jenkins, Pong-Fei Lu (2013)

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DOI: 10.1016/J.MICROREL.2013.07.039

access: closed

type: Journal Article

metadata version: 2020-02-22

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Keith A. Jenkins, Pong-Fei Lu:
On-chip circuit to monitor long-term NBTI and PBTI degradation. Microelectron. Reliab. 53(9-11): 1252-1256 (2013)

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