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"Field Failure Mechanism Investigation of GaAs based HBT Power Amplifier ..."

Jae-Seong Jeong, Jong-Shin Ha, Sang-Deuk Park (2004)

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DOI: 10.1016/J.MICROREL.2004.07.022

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jae-Seong Jeong, Jong-Shin Ha, Sang-Deuk Park:
Field Failure Mechanism Investigation of GaAs based HBT Power Amplifier Mmodule (PAM). Microelectron. Reliab. 44(9-11): 1393-1398 (2004)

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